You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output. Click here to find out more.
Observability-Aware Post-Silicon Test Generation
Post-Silicon Validation and Debug
Springer, Cham, January 2019
Farimah Farahmandi, Prabhat Mishra, Farahmandi, Farimah, Mishra, Prabhat
The data shown below were compiled from readership statistics for 1 Mendeley reader of this research output. Click here to see the associated Mendeley record.
|Readers by professional status||Count||As %|
|Student > Ph. D. Student||1||100%|
|Readers by discipline||Count||As %|