Scanning Probe Microscopy
Springer New York
Chapter title |
Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy
|
---|---|
Chapter number | 7 |
Book title |
Scanning Probe Microscopy
|
Published by |
Springer, New York, NY, January 2007
|
DOI | 10.1007/978-0-387-28668-6_7 |
Book ISBNs |
978-0-387-28667-9, 978-0-387-28668-6
|
Authors |
A. L. Kholkin, S. V. Kalinin, A. Roelofs, A. Gruverman |
Country | Count | As % |
---|---|---|
United States | 5 | 2% |
France | 1 | <1% |
Ireland | 1 | <1% |
Brazil | 1 | <1% |
Germany | 1 | <1% |
India | 1 | <1% |
Israel | 1 | <1% |
Russia | 1 | <1% |
Belgium | 1 | <1% |
Other | 0 | 0% |
Unknown | 221 | 94% |
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 84 | 36% |
Researcher | 43 | 18% |
Student > Master | 27 | 12% |
Student > Doctoral Student | 15 | 6% |
Student > Bachelor | 12 | 5% |
Other | 29 | 12% |
Unknown | 24 | 10% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 84 | 36% |
Physics and Astronomy | 52 | 22% |
Engineering | 29 | 12% |
Chemistry | 16 | 7% |
Chemical Engineering | 3 | 1% |
Other | 10 | 4% |
Unknown | 40 | 17% |