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Timeline
Chapter title |
Investigation on Switching Operation in Resistive RAM Using In-Situ TEM
|
---|---|
Chapter number | 24 |
Book title |
3rd International Multidisciplinary Microscopy and Microanalysis Congress (InterM)
|
Published in |
ADS, January 2017
|
DOI | 10.1007/978-3-319-46601-9_24 |
Book ISBNs |
978-3-31-946600-2, 978-3-31-946601-9
|
Authors |
Masashi Arita, Yasuo Takahashi |