FIB Nanostructures
Springer International Publishing
Chapter title |
Low-Current Focused Ion Beam Milling for Freestanding Nanomaterial Characterization
|
---|---|
Chapter number | 3 |
Book title |
FIB Nanostructures
|
Published by |
Springer, Cham, January 2013
|
DOI | 10.1007/978-3-319-02874-3_3 |
Book ISBNs |
978-3-31-902873-6, 978-3-31-902874-3
|
Authors |
Wuxia Li, Ajuan Cui, Changzhi Gu, Li, Wuxia, Cui, Ajuan, Gu, Changzhi |
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Student > Master | 2 | 67% |
Unknown | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 2 | 67% |
Unknown | 1 | 33% |