Springer Handbook of Engineering Statistics
Springer Science & Business Media
Chapter title |
Modeling and Analyzing Yield, Burn-In and Reliability for Semiconductor Manufacturing: Overview
|
---|---|
Chapter number | 9 |
Book title |
Springer Handbook of Engineering Statistics
|
Published by |
Springer, London, January 2006
|
DOI | 10.1007/978-1-84628-288-1_9 |
Book ISBNs |
978-1-85233-806-0, 978-1-84628-288-1
|
Authors |
Way Kuo, Kyungmee Kim, Taeho Kim, Kuo, Way, Kim, Kyungmee, Kim, Taeho |
Country | Count | As % |
---|---|---|
Unknown | 8 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Unspecified | 2 | 25% |
Student > Master | 2 | 25% |
Professor | 1 | 13% |
Student > Bachelor | 1 | 13% |
Student > Ph. D. Student | 1 | 13% |
Other | 0 | 0% |
Unknown | 1 | 13% |
Readers by discipline | Count | As % |
---|---|---|
Unspecified | 2 | 25% |
Business, Management and Accounting | 2 | 25% |
Engineering | 2 | 25% |
Unknown | 2 | 25% |