Proceedings of the 33rd International MATADOR Conference
Springer London
Chapter title |
Developing contouring testing device for CNC machine tools
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Chapter number | 42 |
Book title |
Proceedings of the 33rd International MATADOR Conference
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Published by |
Springer, London, January 2000
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DOI | 10.1007/978-1-4471-0777-4_42 |
Book ISBNs |
978-1-4471-1200-6, 978-1-4471-0777-4
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Authors |
Jywe Wen-Yuh, Wen-Yuh, Jywe |