Advanced Computing in Electron Microscopy
Springer US
Chapter title |
Sampling and the Fast Fourier Transform
|
---|---|
Chapter number | 4 |
Book title |
Advanced Computing in Electron Microscopy
|
Published by |
Springer, Boston, MA, January 2010
|
DOI | 10.1007/978-1-4419-6533-2_4 |
Book ISBNs |
978-1-4419-6532-5, 978-1-4419-6533-2
|
Authors |
Earl J. Kirkland |
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 2 | 67% |
Unknown | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 1 | 33% |
Unknown | 2 | 67% |