Proceedings of the International Conference on Information Engineering and Applications (IEA) 2012
Springer London
Chapter title |
Shanghai World Expo Influential Quantitative Assessment Model
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Chapter number | 65 |
Book title |
Proceedings of the International Conference on Information Engineering and Applications (IEA) 2012
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Published by |
Springer, London, January 2013
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DOI | 10.1007/978-1-4471-4847-0_65 |
Book ISBNs |
978-1-4471-4846-3, 978-1-4471-4847-0
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Authors |
Ran-Wang Jin, Jun-Guo Ya, Jie-Geng Shu, Juan Zhao Tong, Jin, Ran-Wang, Ya, Jun-Guo, Shu, Jie-Geng, Tong, Juan Zhao |