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Integrated Circuit Test Engineering

Overview of attention for book
Cover of 'Integrated Circuit Test Engineering'

Table of Contents

  1. Altmetric Badge
    Book Overview
  2. Altmetric Badge
    Chapter 1 Introduction to Integrated Circuit Test Engineering
  3. Altmetric Badge
    Chapter 2 Fabrication Processes for Integrated Circuits
  4. Altmetric Badge
    Chapter 3 Digital Logic Test
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    Chapter 4 Memory Test
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    Chapter 5 Analogue Test
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    Chapter 6 Mixed-Signal Test
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    Chapter 7 Input-Output Test
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    Chapter 8 Design for Testability — Structured Test Approaches
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    Chapter 9 System on a Chip (SoC) Test
  11. Altmetric Badge
    Chapter 10 Test Pattern Generation and Fault Simulation
  12. Altmetric Badge
    Chapter 11 Automatic Test Equipment (ATE) and Production Test
  13. Altmetric Badge
    Chapter 12 Test Economics
Attention for Chapter 3: Digital Logic Test
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Summary
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Chapter title
Digital Logic Test
Chapter number 3
Book title
Integrated Circuit Test Engineering
Published by
Springer, London, January 2006
DOI 10.1007/1-84628-173-3_3
Book ISBNs
978-1-84628-023-8, 978-1-84628-173-0
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