You are seeing a free-to-access but limited selection of the activity Altmetric has collected about this research output.
Click here to find out more.
Chapter title |
Statistical Characterization of Flicker Noise Fluctuation of a Nano-Scale NMOS Transistor
|
---|---|
Chapter number | 21 |
Book title |
Advanced Nanomaterials and Nanotechnology
|
Published by |
Springer, Berlin, Heidelberg, January 2013
|
DOI | 10.1007/978-3-642-34216-5_21 |
Book ISBNs |
978-3-64-234215-8, 978-3-64-234216-5
|
Authors |
Sarmista Sengupta, Soumya Pandit |