Structural, Syntactic, and Statistical Pattern Recognition
Springer Science & Business Media
Title |
Structural, Syntactic, and Statistical Pattern Recognition
|
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Published by |
Springer Science & Business Media, August 2006
|
DOI | 10.1007/11815921 |
ISBNs |
978-3-54-037236-3, 978-3-54-037241-7
|
Editors |
Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder |
Country | Count | As % |
---|---|---|
Canada | 1 | 50% |
United States | 1 | 50% |
Type | Count | As % |
---|---|---|
Science communicators (journalists, bloggers, editors) | 1 | 50% |
Members of the public | 1 | 50% |
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Student > Ph. D. Student | 1 | 33% |
Student > Bachelor | 1 | 33% |
Student > Master | 1 | 33% |
Readers by discipline | Count | As % |
---|---|---|
Physics and Astronomy | 1 | 33% |
Energy | 1 | 33% |
Engineering | 1 | 33% |