Theory and Practice of Thermal Transient Testing of Electronic Components
Springer International Publishing
Chapter title |
Temperature-Dependent Electrical Characteristics of Semiconductor Devices
|
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Chapter number | 4 |
Book title |
Theory and Practice of Thermal Transient Testing of Electronic Components
|
Published by |
Springer, Cham, January 2022
|
DOI | 10.1007/978-3-030-86174-2_4 |
Book ISBNs |
978-3-03-086173-5, 978-3-03-086174-2
|
Authors |
Farkas, Gábor |
Country | Count | As % |
---|---|---|
Unknown | 3 | 100% |
Readers by professional status | Count | As % |
---|---|---|
Professor | 1 | 33% |
Unknown | 2 | 67% |
Readers by discipline | Count | As % |
---|---|---|
Materials Science | 1 | 33% |
Unknown | 2 | 67% |