Photon Emission Modeling and Machine-Learning Assisted Pre-Silicon Optical Side-Channel Simulation
Conference proceeding (May 2024)
The most recent citing publications are shown below. View all 24 publications that cite this research output on Dimensions.
FLAT: Layout-Aware and Security Property-Assisted Timing Fault-Injection Attack Assessment
Article in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (March 2024)
Enhancing counterfeit detection of integrated circuits through machine learning-assisted THz-TDS analysis
Conference proceeding in Proceedings of SPIE--the International Society for Optical Engineering (March 2024)